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01817nam a22004335i 4500 |
| 001 |
978-1-4020-8615-1 |
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20191022052924.0 |
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cr nn 008mamaa |
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100301s2008 ne | s |||| 0|eng d |
| 020 |
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|a 9781402086151
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| 024 |
7 |
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|a 10.1007/978-1-4020-8615-1
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 245 |
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|a Microscopy of Semiconducting Materials 2007
|b Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK /
|c edited by A.G. Cullis, P.A. Midgley.
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| 250 |
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|a 1st ed. 2008.
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| 260 |
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|a Dordrecht :
|b Springer Netherlands :
|b Imprint: Springer,
|c 2008.
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| 300 |
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|a XIV, 498 p.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Springer Proceedings in Physics,
|v 120
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| 505 |
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|a Wide Band-Gap Nitrides -- General Heteroepitaxial Layers -- High Resolution Microscopy and Nanoanalysis -- Self-Organised and Quantum Domain Structures -- Processed Silicon and Other Device Materials -- Device and Doping Studies -- FIB, SEM and SPM Advances.
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| 650 |
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|a Materials science.
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| 650 |
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|a Solid state physics.
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| 650 |
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|a Spectroscopy.
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| 650 |
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|a Microscopy.
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| 650 |
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|a Physical measurements.
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| 650 |
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|a Measurement .
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| 650 |
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|a Electronics.
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| 650 |
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|a Microelectronics.
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| 650 |
1 |
4 |
|a Materials Science, general.
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| 650 |
2 |
4 |
|a Solid State Physics.
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| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
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| 650 |
2 |
4 |
|a Measurement Science and Instrumentation.
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| 650 |
2 |
4 |
|a Electronics and Microelectronics, Instrumentation.
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| 700 |
1 |
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|a Cullis, A.G.
|e editor.
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| 700 |
1 |
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|a Midgley, P.A.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 856 |
4 |
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|u https://doi.org/10.1007/978-1-4020-8615-1
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