Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK /

Microscopy of Semiconducting Materials 2007 Proceedings of the 15th Conference, 2-5 April 2007, Cambridge, UK /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Cullis, A.G. (Editor), Midgley, P.A. (Editor)
Format: eBook
Language:English
Published: Dordrecht : Springer Netherlands : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:Springer Proceedings in Physics, 120
Subjects:
Materials science.
Solid state physics.
Spectroscopy.
Microscopy.
Physical measurements.
Measurement   .
Electronics.
Microelectronics.
Materials Science, general.
Solid State Physics.
Spectroscopy and Microscopy.
Measurement Science and Instrumentation.
Electronics and Microelectronics, Instrumentation.
Online Access:https://doi.org/10.1007/978-1-4020-8615-1
Table of Contents:
  • Wide Band-Gap Nitrides
  • General Heteroepitaxial Layers
  • High Resolution Microscopy and Nanoanalysis
  • Self-Organised and Quantum Domain Structures
  • Processed Silicon and Other Device Materials
  • Device and Doping Studies
  • FIB, SEM and SPM Advances.

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