Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials /
| Main Authors: | , , |
|---|---|
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2010.
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| Edition: | 2nd ed. 2010. |
| Series: | Springer Series in Advanced Microelectronics,
10 |
| Subjects: |
Table of Contents:
- Introduction
- Physical and Technical Basics
- Timing Strategies
- Heat Dissipation Mechanisms in Solar Cells
- Carrier Density Imaging
- Illuminated Lock-in Thermography (ILIT)
- Experimental Technique
- Theory
- Measurement Strategies
- Typical Applications
- Summary and Outlook.