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02063nam a22003255i 4500 |
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121120s2013 xxu| s |||| 0|eng d |
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|a 9781461445876
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024 |
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|a 10.1007/978-1-4614-4587-6
|2 doi
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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|a Nyquist AD Converters, Sensor Interfaces, and Robustness :
|b Advances in Analog Circuit Design, 2012 /
|c edited by Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert.
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250 |
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|a 1st ed. 2013.
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260 |
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|a New York, NY :
|b Springer New York :
|b Imprint: Springer,
|c 2013.
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300 |
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|a X, 294 p. :
|b online resource.
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Part I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
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|a Electronic circuits.
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|a Electronics.
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|a Microelectronics.
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|a Circuits and Systems.
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|a Electronics and Microelectronics, Instrumentation.
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|a van Roermund, Arthur H.M.
|e editor.
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|a Baschirotto, Andrea.
|e editor.
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|a Steyaert, Michiel.
|e editor.
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2 |
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|a SpringerLink (Online service)
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|t Springer eBooks
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