Nyquist AD Converters, Sensor Interfaces, and Robustness : Advances in Analog Circuit Design, 2012 /
| Autor Corporativo: | |
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| Otros Autores: | , , |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
New York, NY :
Springer New York : Imprint: Springer,
2013.
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| Edición: | 1st ed. 2013. |
| Materias: |
Tabla de Contenidos:
- Part I: Nyquist A/D Converters
- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes
- Dual Residue Pipeline ADC
- Time-Interleaved SAR and Slope Converters
- GS/s AD Conversion for Broadband Multi-Stream Reception
- CMOS Ultra High-Speed Time-Interleaved ADCs
- CMOS ADCs for Optical Communications
- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow
- Energy-Efficient Capacitive Sensor Interfaces
- Interface Circuits for MEMS Microphones
- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments
- Part III: Robustness
- How Can Chips Live Under Radiation?
- TDC and Rad Environments
- Matching and Resolution
- Matching in Polymer and Effect on Circuit Topologies
- Statistical Variability and Reliability in Nano-CMOS Transistors.