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Process capability indices for skewed populations. /

Bibliographic Details
Main Author: Chang, Young Soon (creador/a.)
Other Authors: Choi, In Su (creador/a.), Bai, Do Sun (creador/a.)
Format: Book
Language:English
Published: New Jersey, Estados Unidos : John Wiley & Sons Ltd., 2020.
Subjects:

Sistema de Bibliotecas del Tecnológico de Costa Rica

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