Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy /
Main Authors: | , , |
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Corporate Author: | |
Format: | eBook |
Language: | English |
Published: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2008.
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Edition: | 1st ed. 2008. |
Series: | Springer Laboratory, Manuals in Polymer Science,
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Subjects: | |
Online Access: | https://doi.org/10.1007/978-3-540-73994-4 |
Table of Contents:
- Synthetic Membranes for Membrane Processes
- Atomic Force Microscopy
- Nodular Structure of Polymers in the Membrane
- Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface
- Cross-sectional AFM Image
- Adhesion
- Membrane Surface Morphology and Membrane Performance.