Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy /

Bibliographic Details
Main Authors: Khulbe, K. C. (Author), Feng, C. Y. (Author), Matsuura, Takeshi. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edition:1st ed. 2008.
Series:Springer Laboratory, Manuals in Polymer Science,
Subjects:
Online Access:https://doi.org/10.1007/978-3-540-73994-4
Table of Contents:
  • Synthetic Membranes for Membrane Processes
  • Atomic Force Microscopy
  • Nodular Structure of Polymers in the Membrane
  • Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface
  • Cross-sectional AFM Image
  • Adhesion
  • Membrane Surface Morphology and Membrane Performance.