Synthetic Polymeric Membranes Characterization by Atomic Force Microscopy /

Detalles Bibliográficos
Autores principales: Khulbe, K. C. (Autor), Feng, C. Y. (Autor), Matsuura, Takeshi. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edición:1st ed. 2008.
Colección:Springer Laboratory, Manuals in Polymer Science,
Materias:
Acceso en línea:https://doi.org/10.1007/978-3-540-73994-4
Tabla de Contenidos:
  • Synthetic Membranes for Membrane Processes
  • Atomic Force Microscopy
  • Nodular Structure of Polymers in the Membrane
  • Pore Size, Pore Size Distribution, and Roughness at the Membrane Surface
  • Cross-sectional AFM Image
  • Adhesion
  • Membrane Surface Morphology and Membrane Performance.