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02174nam a22003855i 4500 |
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978-3-540-74559-4 |
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20191021222223.0 |
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cr nn 008mamaa |
| 008 |
100301s2009 gw | s |||| 0|eng d |
| 020 |
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|a 9783540745594
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| 024 |
7 |
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|a 10.1007/978-3-540-74559-4
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 245 |
1 |
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|a Into The Nano Era
|b Moore's Law Beyond Planar Silicon CMOS /
|c edited by Howard Huff.
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| 250 |
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|a 1st ed. 2009.
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| 260 |
# |
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2009.
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| 300 |
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|a XXVIII, 348 p. 136 illus.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 490 |
1 |
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|a Springer Series in Materials Science,
|v 106
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| 505 |
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|a Historical Background -- Silicon: Child and Progenitor of Revolution -- The Economic Implications of Moore's Law -- State-of-the-Art -- Using Silicon to Understand Silicon -- Theory of Defects in Si: Past, Present, and Challenges -- Structural, Elemental, and Chemical Complex Defects in Silicon and Their Impact on Silicon Devices -- Surface and Interface Chemistry for Gate Stacks on Silicon -- Enhanced Carrier Mobility for Improved CMOS Performance -- Transistor Scaling to the Limit -- Future Directions -- Beyond CMOS Electronics: Self-Assembled Nanostructures -- Hybrid CMOS/Molecular Integrated Circuits -- Sublithographic Architecture: Shifting the Responsibility for Perfection -- Quantum Computing -- Afterwords -- Nano-Whatever: Do We Really Know Where We Are Heading? -- Silicon Forever! Really?.
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| 650 |
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|a Nanotechnology.
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| 650 |
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|a Electronics.
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| 650 |
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|a Microelectronics.
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| 650 |
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|a Optical materials.
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| 650 |
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0 |
|a Electronic materials.
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| 650 |
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|a Condensed matter.
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| 650 |
1 |
4 |
|a Nanotechnology.
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| 650 |
2 |
4 |
|a Electronics and Microelectronics, Instrumentation.
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| 650 |
2 |
4 |
|a Optical and Electronic Materials.
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| 650 |
2 |
4 |
|a Condensed Matter Physics.
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| 700 |
1 |
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|a Huff, Howard.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 856 |
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|u https://doi.org/10.1007/978-3-540-74559-4
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