Test Pattern Generation using Boolean Proof Engines

Test Pattern Generation using Boolean Proof Engines

Detalles Bibliográficos
Autores principales: Drechsler, Rolf. (Autor), Eggersglüß, Stephan. (Autor), Fey, Görschwin. (Autor), Tille, Daniel. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Materias:
Electronic circuits.
Electronics.
Microelectronics.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
Acceso en línea:https://doi.org/10.1007/978-90-481-2360-5
Tabla de Contenidos:
  • Preliminaries
  • Boolean Satisfiability
  • SAT-Based ATPG
  • Learning Techniques
  • Multiple-Valued Logic
  • Improved Circuit-to-CNF Conversion
  • Branching Strategies
  • Integration into Industrial Flow
  • Delay Faults
  • Summary and Outlook.

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