Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits

Detalles Bibliográficos
Autores principales: Singhee, Amith. (Autor), Rutenbar, Rob A. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2009.
Edición:1st ed. 2009.
Colección:Lecture Notes in Electrical Engineering, 46
Materias:
Electronic circuits.
Data structures (Computer science).
Computer system failures.
Circuits and Systems.
Data Structures.
System Performance and Evaluation.
Acceso en línea:https://doi.org/10.1007/978-90-481-3100-6
Tabla de Contenidos:
  • SiLVR: Projection Pursuit for Response Surface Modeling
  • Quasi-Monte Carlo for Fast Statistical Simulation of Circuits
  • Statistical Blockade: Estimating Rare Event Statistics
  • Concluding Observations.

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