Atomic force microscopy : understanding basic modes and advanced applications /
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Hoboken, New Jersey :
J. Wiley & Sons,
c2012.
|
| Subjects: |
Sistema de Bibliotecas de Universidad de Costa Rica
| Call Number: |
620.5 |
|---|---|
| Copy | Available |