Multiple-beam interference microscopy of metals /

Multiple-beam interference microscopy of metals /

Bibliographic Details
Main Author: Tolansky, Samuel 1907-1973 (Autor/a)
Format: Book
Language:English
Published: New York, New York : Academic, 1970.
Subjects:
METALOGRAFIA
INTERFERENCIA MICROSCOPICA
Description
Item Description:Incluye indice.
Physical Description:147 páginas : ilustraciones.
ISBN:0126926506

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