Advanced test methods for SRAMs : effective solutions for dynamic fault detection in nanoscaled technologies. /
| Main Author: | |
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| Other Authors: | , , , |
| Format: | Book |
| Language: | English |
| Published: |
New York, N.Y. :
Springer,
[2010].
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| Subjects: | |
| Online Access: | Ver documento en línea |
Internet
Ver documento en líneaSistema de Bibliotecas de Universidad de Costa Rica
| Call Number: |
621.397.3 |
|---|---|
| Copy | Available |