Atomic scale characterization and first-principles studies of Si3N4 interfaces /
| Formato: | Libro |
|---|---|
| Publicado: |
c2011.
|
| Acceso en línea: | Ver documento en línea |
| LEADER | 00438nam a2200109 a 4500 | ||
|---|---|---|---|
| 001 | 000659357 | ||
| 005 | 20211115113318.0 | ||
| 020 | |a 9781441978172 |q (ebook) | ||
| 040 | |a Sistema de Bibliotecas de Universidad de Costa Rica | ||
| 245 | 1 | 0 | |a Atomic scale characterization and first-principles studies of Si3N4 interfaces / |c Weronika Walkosz. |
| 260 | |c c2011. | ||
| 856 | 4 | 1 | |u https://springerlink.proxyucr.elogim.com/book/10.1007/978-1-4419-7817-2 |y Ver documento en línea |