Advances in X-Ray Analysis / Edited by William M. Mueller ; sponsored by University Denver
| Autor principal: | |
|---|---|
| Formato: | Libro |
| Lenguaje: | Undetermined |
| Publicado: |
New York : Plenum Press
|
| Materias: |
| LEADER | 00445nam a2200133Ia 4500 | ||
|---|---|---|---|
| 008 | 240709s9999||||xx |||||||||||||| ||und|| | ||
| 040 | |a Sistema de Bibliotecas de UNAN-LEON | ||
| 082 | |a 620.112 D | ||
| 100 | |a Mueller, William M. | ||
| 245 | 0 | |b Advances in X-Ray Analysis / Edited by William M. Mueller ; sponsored by University Denver | |
| 260 | |a New York : Plenum Press | ||
| 300 | |a v.4 il. | ||
| 650 | |a 1.RAYOS X -APLICACIONES INDUSTRIALES | ||
| 999 | |c 61941 | ||