Skip to content
VuFind
Language
English
Español
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
Search
NANOMETER TECHNOLOGY EFFECTS O...
Description
Cite this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Export to MARC
Export to RDF
Export to BibTeX
Export to RIS
NANOMETER TECHNOLOGY EFFECTS ON FAULT MODELS FOR IC TESTING.
Bibliographic Details
Main Author:
AITKEN, ROBERT C.
Format:
Article
Language:
Spanish
Subjects:
CIRCUITOS
TECNOLOGIA
CIRCUITOS INTEGRADOS
Artículos de revista
Holdings
Description
Similar Items
Staff View
Description
Description not available.
Similar Items
High-speed digital IC technologies /
by: Rocchi, Marc
Published: (1990)
IC timer handbook : -- with 100 projects & experiements /
by: Carr, Joseph J., et al.
Published: (1981)
Analog IC reliability in nanometer CMOS /
by: Maricau, Elie
Published: (2013)
System-on-chip test architectures : nanometer design for testability /
Published: (2008)
Compatibility and testing of electronic components /
by: Jowett, Charles Eric, et al.
Published: (1972)
×
Loading...