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Classification of fungal infected wheat kernels using near - infrared reflectance hyperspectral imaging and support vector machine.
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Classification of fungal infected wheat kernels using near - infrared reflectance hyperspectral imaging and support vector machine.

Bibliographic Details
Main Author: Zhang, H.
Other Authors: Jayas, D. S., Paliwal, J., White, N. D. G.
Format: Article
Language:Spanish
Subjects:
Hongos
Vectores
Algoritmos
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