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01977nam a22004455i 4500 |
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121009s2013 gw | s |||| 0|eng d |
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|a 9783642274947
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024 |
7 |
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|a 10.1007/978-3-642-27494-7
|2 doi
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040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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245 |
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|a Acoustic Scanning Probe Microscopy /
|c edited by Francesco Marinello, Daniele Passeri, Enrico Savio.
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250 |
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|a 1st ed. 2013.
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260 |
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2013.
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300 |
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|a XXVI, 494 p. :
|b online resource.
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336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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338 |
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|a online resource
|b cr
|2 rdacarrier
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490 |
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|a NanoScience and Technology,
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505 |
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|a From the contents: Overview of acoustic techniques -- Contact dynamics modelling -- Cantilever dynamics: theoretical modeling -- Finite elements modelling -- AFAM calibration -- Enhanced sensitivity -- UAFM -- Holography calibration -- UFM -- Friction/lateral techniques -- Harmonix -- Scanning microdeformation microscopy (SMM) -- Tip wear -- Comparison with other techniques -- Applications polymer -- Thin films.
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650 |
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|a Lasers.
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650 |
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|a Photonics.
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650 |
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|a Nanotechnology.
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650 |
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|a Acoustics.
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650 |
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|a Materials science.
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650 |
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|a Materials—Surfaces.
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650 |
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|a Thin films.
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650 |
1 |
4 |
|a Optics, Lasers, Photonics, Optical Devices.
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650 |
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4 |
|a Nanotechnology and Microengineering.
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650 |
2 |
4 |
|a Acoustics.
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650 |
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4 |
|a Nanotechnology.
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650 |
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|a Characterization and Evaluation of Materials.
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650 |
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4 |
|a Surfaces and Interfaces, Thin Films.
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700 |
1 |
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|a Marinello, Francesco.
|e editor.
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700 |
1 |
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|a Passeri, Daniele.
|e editor.
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700 |
1 |
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|a Savio, Enrico.
|e editor.
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710 |
2 |
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|a SpringerLink (Online service)
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773 |
0 |
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|t Springer eBooks
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900 |
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|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
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