Acoustic Scanning Probe Microscopy /
| Autor Corporativo: | |
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| Otros Autores: | , , |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2013.
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| Edición: | 1st ed. 2013. |
| Colección: | NanoScience and Technology,
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| Materias: |
Tabla de Contenidos:
- From the contents: Overview of acoustic techniques
- Contact dynamics modelling
- Cantilever dynamics: theoretical modeling
- Finite elements modelling
- AFAM calibration
- Enhanced sensitivity
- UAFM
- Holography calibration
- UFM
- Friction/lateral techniques
- Harmonix
- Scanning microdeformation microscopy (SMM)
- Tip wear
- Comparison with other techniques
- Applications polymer
- Thin films.