Acoustic Scanning Probe Microscopy /

Acoustic Scanning Probe Microscopy /

Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Marinello, Francesco. (Editor), Passeri, Daniele. (Editor), Savio, Enrico. (Editor)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edition:1st ed. 2013.
Series:NanoScience and Technology,
Subjects:
Lasers.
Photonics.
Nanotechnology.
Acoustics.
Materials science.
Materials-Surfaces.
Thin films.
Optics, Lasers, Photonics, Optical Devices.
Nanotechnology and Microengineering.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Table of Contents:
  • From the contents: Overview of acoustic techniques
  • Contact dynamics modelling
  • Cantilever dynamics: theoretical modeling
  • Finite elements modelling
  • AFAM calibration
  • Enhanced sensitivity
  • UAFM
  • Holography calibration
  • UFM
  • Friction/lateral techniques
  • Harmonix
  • Scanning microdeformation microscopy (SMM)
  • Tip wear
  • Comparison with other techniques
  • Applications polymer
  • Thin films.

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