Design, Analysis and Test of Logic Circuits Under Uncertainty /

Detalles Bibliográficos
Autores principales: Krishnaswamy, Smita. (Autor), Markov, Igor L. (Autor), Hayes, John P. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:Lecture Notes in Electrical Engineering, 115
Materias:
LEADER 01724nam a22004215i 4500
001 000283070
005 20210505134246.0
007 cr nn 008mamaa
008 120921s2013 ne | s |||| 0|eng d
020 |a 9789048196449 
024 7 |a 10.1007/978-90-481-9644-9  |2 doi 
040 |a Sistema de Bibliotecas del TEC 
100 1 |a Krishnaswamy, Smita.  |e author. 
245 1 0 |a Design, Analysis and Test of Logic Circuits Under Uncertainty /  |c by Smita Krishnaswamy, Igor L. Markov, John P. Hayes. 
250 |a 1st ed. 2013. 
260 # # |a Dordrecht :  |b Springer Netherlands :  |b Imprint: Springer,  |c 2013. 
300 |a XII, 124 p. :  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a Lecture Notes in Electrical Engineering,  |v 115 
505 0 |a Introduction -- Probabilistic Transfer Matrices -- Computing with Probabilistic Transfer Matrices -- Testing Logic Circuits for Probabilistic Faults -- Signtaure-based Reliability Analysis -- Design for Robustness -- Summary and Extensions. 
650 0 |a Electronic circuits. 
650 0 |a Arithmetic and logic units, Computer. 
650 0 |a Computer hardware. 
650 0 |a Computer software—Reusability. 
650 0 |a Logic design. 
650 0 |a Computer science—Mathematics. 
650 1 4 |a Circuits and Systems. 
650 2 4 |a Arithmetic and Logic Structures. 
650 2 4 |a Computer Hardware. 
650 2 4 |a Performance and Reliability. 
650 2 4 |a Logic Design. 
650 2 4 |a Symbolic and Algebraic Manipulation. 
700 1 |a Markov, Igor L.  |e author. 
700 1 |a Hayes, John P.  |e author. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks