Design, Analysis and Test of Logic Circuits Under Uncertainty /

Design, Analysis and Test of Logic Circuits Under Uncertainty /

Detalles Bibliográficos
Autores principales: Krishnaswamy, Smita. (Autor), Markov, Igor L. (Autor), Hayes, John P. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:Lecture Notes in Electrical Engineering, 115
Materias:
Electronic circuits.
Arithmetic and logic units, Computer.
Computer hardware.
Computer software-Reusability.
Logic design.
Computer science-Mathematics.
Circuits and Systems.
Arithmetic and Logic Structures.
Computer Hardware.
Performance and Reliability.
Logic Design.
Symbolic and Algebraic Manipulation.
Tabla de Contenidos:
  • Introduction
  • Probabilistic Transfer Matrices
  • Computing with Probabilistic Transfer Matrices
  • Testing Logic Circuits for Probabilistic Faults
  • Signtaure-based Reliability Analysis
  • Design for Robustness
  • Summary and Extensions.

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