Design, Analysis and Test of Logic Circuits Under Uncertainty /

Design, Analysis and Test of Logic Circuits Under Uncertainty /

Detalles Bibliográficos
Autores principales: Krishnaswamy, Smita. (Autor), Markov, Igor L. (Autor), Hayes, John P. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Dordrecht : Springer Netherlands : Imprint: Springer, 2013.
Edición:1st ed. 2013.
Colección:Lecture Notes in Electrical Engineering, 115
Materias:
Electronic circuits.
Arithmetic and logic units, Computer.
Computer hardware.
Computer software—Reusability.
Logic design.
Computer science—Mathematics.
Circuits and Systems.
Arithmetic and Logic Structures.
Computer Hardware.
Performance and Reliability.
Logic Design.
Symbolic and Algebraic Manipulation.
Tabla de Contenidos:
  • Introduction
  • Probabilistic Transfer Matrices
  • Computing with Probabilistic Transfer Matrices
  • Testing Logic Circuits for Probabilistic Faults
  • Signtaure-based Reliability Analysis
  • Design for Robustness
  • Summary and Extensions.

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