New Horizons of Applied Scanning Electron Microscopy /

New Horizons of Applied Scanning Electron Microscopy /

Bibliographic Details
Main Authors: Shimizu, Kenichi. (Author), Mitani, Tomoaki. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edition:1st ed. 2010.
Series:Springer Series in Surface Sciences, 45
Subjects:
Materials-Surfaces.
Thin films.
Physical measurements.
Measurement   .
Solid state physics.
Spectroscopy.
Microscopy.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Measurement Science and Instrumentation.
Solid State Physics.
Spectroscopy and Microscopy.
Nanotechnology and Microengineering.
Description
Physical Description:XIV, 182 p. 102 illus., 25 illus. in color. : online resource.
ISBN:9783642031601

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