Reliability Physics and Engineering : Time-To-Failure Modeling /
| Main Author: | |
|---|---|
| Corporate Author: | |
| Format: | eBook |
| Language: | English |
| Published: |
Cham :
Springer International Publishing : Imprint: Springer,
2013.
|
| Edition: | 2nd ed. 2013. |
| Subjects: |
Table of Contents:
- Introduction
- Materials and Device Degradation
- From Material/Device Degradation to Time-To-Failure
- Time-To-Failure Modeling
- Gaussian Statistics - An Overview
- Time-To-Failure Statistics
- Failure Rate Modeling
- Accelerated Degradation
- Acceleration Factor Modeling
- Ramp-To-Failure Testing
- Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits Breakdown (TDDB)
- Time-To-Failure Models for Selected Failure Mechanisms In Mechanical Engineering
- Conversion of Dynamical Stresses Into Effective Static Values
- Increasing the Reliability of Device/Product Designs
- Screening
- Heat Generation and Dissipation
- Sampling Plans and Confidence Intervals
- Appendix A: Useful Conversion Factors
- Appendix B: Useful Physical Constants
- Appendix C: Useful Rough Rules-Of-Thumb
- Appendix D: Useful Mathematical Expressions
- Appendix E: Useful Differentials and Definite Integrals
- Appendix F: Free-Energy
- Appendix G: t(1-α/2,ν) Distribution Values
- Appendix H: χ2(P,ν) Distribution Values
- Index.