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|a 9783642035357
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|a 10.1007/978-3-642-03535-7
|2 doi
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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|a Scanning Probe Microscopy in Nanoscience and Nanotechnology /
|c edited by Bharat Bhushan.
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|a 1st ed. 2010.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2010.
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|a XXX, 956 p. 300 illus. :
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a NanoScience and Technology,
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|a Scanning Probe Microscopy Techniques -- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids -- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy -- Polarization-Sensitive Tip-Enhanced Raman Scattering -- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes -- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics -- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity -- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter -- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope -- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy -- Characterization -- Simultaneous Topography and Recognition Imaging -- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM -- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules -- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices -- Quantized Mechanics of Nanotubes and Bundles -- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials -- Mechanical Properties of One-Dimensional Nanostructures -- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale -- Controlling Wear on Nanoscale -- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping -- Industrial Applications -- Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture -- Near-Field Optical Litography -- A New AFM-Based Lithography Method: Thermochemical Nanolithography -- Scanning Probe Alloying Nanolithography -- Structuring the Surface of Crystallizable Polymers with an AFM Tip -- Application of Contact Mode AFM to Manufacturing Processes -- Scanning Probe Microscopy as a Tool Applied to Agriculture.
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|a Nanotechnology.
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|a Condensed matter.
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|a Engineering.
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|a Nanotechnology.
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|a Condensed Matter Physics.
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|a Engineering, general.
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|a Bhushan, Bharat.
|e editor.
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|a SpringerLink (Online service)
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|t Springer eBooks
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