Scanning Probe Microscopy in Nanoscience and Nanotechnology /

Detalles Bibliográficos
Autor Corporativo: SpringerLink (Online service)
Otros Autores: Bhushan, Bharat. (Editor )
Formato: eBook
Lenguaje:English
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2010.
Edición:1st ed. 2010.
Colección:NanoScience and Technology,
Materias:
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020 |a 9783642035357 
024 7 |a 10.1007/978-3-642-03535-7  |2 doi 
040 |a Sistema de Bibliotecas del Tecnológico de Costa Rica 
245 1 0 |a Scanning Probe Microscopy in Nanoscience and Nanotechnology /  |c edited by Bharat Bhushan. 
250 |a 1st ed. 2010. 
260 # # |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg :  |b Imprint: Springer,  |c 2010. 
300 |a XXX, 956 p. 300 illus. :  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 1 |a NanoScience and Technology, 
505 0 |a Scanning Probe Microscopy Techniques -- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids -- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy -- Polarization-Sensitive Tip-Enhanced Raman Scattering -- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes -- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics -- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity -- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter -- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope -- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy -- Characterization -- Simultaneous Topography and Recognition Imaging -- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM -- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules -- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices -- Quantized Mechanics of Nanotubes and Bundles -- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials -- Mechanical Properties of One-Dimensional Nanostructures -- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale -- Controlling Wear on Nanoscale -- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping -- Industrial Applications -- Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture -- Near-Field Optical Litography -- A New AFM-Based Lithography Method: Thermochemical Nanolithography -- Scanning Probe Alloying Nanolithography -- Structuring the Surface of Crystallizable Polymers with an AFM Tip -- Application of Contact Mode AFM to Manufacturing Processes -- Scanning Probe Microscopy as a Tool Applied to Agriculture. 
650 0 |a Nanotechnology. 
650 0 |a Condensed matter. 
650 0 |a Engineering. 
650 1 4 |a Nanotechnology. 
650 2 4 |a Condensed Matter Physics. 
650 2 4 |a Engineering, general. 
700 1 |a Bhushan, Bharat.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks