Scanning Probe Microscopy in Nanoscience and Nanotechnology /
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| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2010.
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| Edición: | 1st ed. 2010. |
| Colección: | NanoScience and Technology,
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| Materias: |
Tabla de Contenidos:
- Scanning Probe Microscopy Techniques
- Dynamic Force Microscopy and Spectroscopy Using the Frequency-Modulation Technique in Air and Liquids
- Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy
- Polarization-Sensitive Tip-Enhanced Raman Scattering
- Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes
- Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics
- Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity
- Combining Atomic Force Microscopy and Depth-Sensing Instruments for the Nanometer-Scale Mechanical Characterization of Soft Matter
- Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope
- Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy
- Characterization
- Simultaneous Topography and Recognition Imaging
- Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM
- Force-Extension and Force-Clamp AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical Properties of Single Biomolecules
- Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices
- Quantized Mechanics of Nanotubes and Bundles
- Spin and Charge Pairing Instabilities in Nanoclusters and Nanomaterials
- Mechanical Properties of One-Dimensional Nanostructures
- Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale
- Controlling Wear on Nanoscale
- Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping
- Industrial Applications
- Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture
- Near-Field Optical Litography
- A New AFM-Based Lithography Method: Thermochemical Nanolithography
- Scanning Probe Alloying Nanolithography
- Structuring the Surface of Crystallizable Polymers with an AFM Tip
- Application of Contact Mode AFM to Manufacturing Processes
- Scanning Probe Microscopy as a Tool Applied to Agriculture.