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02643nam a22004095i 4500 |
| 001 |
978-0-387-76501-3 |
| 005 |
20191027092512.0 |
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cr nn 008mamaa |
| 008 |
100301s2009 xxu| s |||| 0|eng d |
| 020 |
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|a 9780387765013
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| 024 |
7 |
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|a 10.1007/978-0-387-76501-3
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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| 100 |
1 |
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|a Williams, David B.
|e author.
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| 245 |
1 |
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|a Transmission Electron Microscopy
|b A Textbook for Materials Science /
|c by David B. Williams, C. Barry Carter.
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| 250 |
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|a 2nd ed. 2009.
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| 260 |
# |
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|a New York, NY :
|b Springer US :
|b Imprint: Springer,
|c 2009.
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| 300 |
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|a CCXLVIII, 820 p.
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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| 337 |
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|a computer
|b c
|2 rdamedia
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| 338 |
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|a online resource
|b cr
|2 rdacarrier
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| 505 |
0 |
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|a Basics -- The Transmission Electron Microscope -- Scattering and Diffraction -- Elastic Scattering -- Inelastic Scattering and Beam Damage -- Electron Sources -- Lenses, Apertures, and Resolution -- How to ‘See’ Electrons -- Pumps and Holders -- The Instrument -- Specimen Preparation -- Diffraction -- Diffraction in TEM -- Thinking in Reciprocal Space -- Diffracted Beams -- Bloch Waves -- Dispersion Surfaces -- Diffraction from Crystals -- Diffraction from Small Volumes -- Obtaining and Indexing Parallel-Beam Diffraction Patterns -- Kikuchi Diffraction -- Obtaining CBED Patterns -- Using Convergent-Beam Techniques -- Imaging -- Amplitude Contrast -- Phase-Contrast Images -- Thickness and Bending Effects -- Planar Defects -- Imaging Strain Fields -- Weak-Beam Dark-Field Microscopy -- High-Resolution TEM -- Other Imaging Techniques -- Image Simulation -- Processing and Quantifying Images -- Spectrometry -- X-ray Spectrometry -- X-ray Spectra and Images -- Qualitative X-ray Analysis and Imaging -- Quantitative X-ray Analysis -- Spatial Resolution and Minimum Detection -- Electron Energy-Loss Spectrometers and Filters -- Low-Loss and No-Loss Spectra and Images -- High Energy-Loss Spectra and Images -- Fine Structure and Finer Details.
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| 650 |
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|a Materials science.
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| 650 |
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0 |
|a Nanotechnology.
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| 650 |
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|a Solid state physics.
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| 650 |
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0 |
|a Spectroscopy.
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| 650 |
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0 |
|a Microscopy.
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| 650 |
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0 |
|a Mechanics.
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| 650 |
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|a Mechanics, Applied.
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| 650 |
1 |
4 |
|a Characterization and Evaluation of Materials.
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| 650 |
2 |
4 |
|a Nanotechnology.
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| 650 |
2 |
4 |
|a Solid State Physics.
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| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
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| 650 |
2 |
4 |
|a Solid Mechanics.
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| 700 |
1 |
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|a Carter, C. Barry.
|e author.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
0 |
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|t Springer eBooks
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| 856 |
4 |
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|u https://doi.org/10.1007/978-0-387-76501-3
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