Transmission Electron Microscopy A Textbook for Materials Science /
| Autores principales: | , |
|---|---|
| Autor Corporativo: | |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2009.
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| Edición: | 2nd ed. 2009. |
| Materias: | |
| Acceso en línea: | https://doi.org/10.1007/978-0-387-76501-3 |
Tabla de Contenidos:
- Basics
- The Transmission Electron Microscope
- Scattering and Diffraction
- Elastic Scattering
- Inelastic Scattering and Beam Damage
- Electron Sources
- Lenses, Apertures, and Resolution
- How to ‘See’ Electrons
- Pumps and Holders
- The Instrument
- Specimen Preparation
- Diffraction
- Diffraction in TEM
- Thinking in Reciprocal Space
- Diffracted Beams
- Bloch Waves
- Dispersion Surfaces
- Diffraction from Crystals
- Diffraction from Small Volumes
- Obtaining and Indexing Parallel-Beam Diffraction Patterns
- Kikuchi Diffraction
- Obtaining CBED Patterns
- Using Convergent-Beam Techniques
- Imaging
- Amplitude Contrast
- Phase-Contrast Images
- Thickness and Bending Effects
- Planar Defects
- Imaging Strain Fields
- Weak-Beam Dark-Field Microscopy
- High-Resolution TEM
- Other Imaging Techniques
- Image Simulation
- Processing and Quantifying Images
- Spectrometry
- X-ray Spectrometry
- X-ray Spectra and Images
- Qualitative X-ray Analysis and Imaging
- Quantitative X-ray Analysis
- Spatial Resolution and Minimum Detection
- Electron Energy-Loss Spectrometers and Filters
- Low-Loss and No-Loss Spectra and Images
- High Energy-Loss Spectra and Images
- Fine Structure and Finer Details.