|
|
|
|
| LEADER |
01909nam a22004335i 4500 |
| 001 |
978-3-540-73886-2 |
| 005 |
20191022023239.0 |
| 007 |
cr nn 008mamaa |
| 008 |
100301s2008 gw | s |||| 0|eng d |
| 020 |
|
|
|a 9783540738862
|
| 024 |
7 |
|
|a 10.1007/978-3-540-73886-2
|2 doi
|
| 040 |
|
|
|a Sistema de Bibliotecas del Tecnológico de Costa Rica
|
| 100 |
1 |
|
|a Fultz, Brent.
|e author.
|
| 245 |
1 |
0 |
|a Transmission Electron Microscopy and Diffractometry of Materials
|c by Brent Fultz, James Howe.
|
| 250 |
|
|
|a 3rd ed. 2008.
|
| 260 |
# |
# |
|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2008.
|
| 300 |
|
|
|a XX, 758 p. 440 illus.
|b online resource.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 505 |
0 |
|
|a Diffraction and the X-Ray Powder Diffractometer -- The TEM and its Optics -- Scattering -- Inelastic Electron Scattering and Spectroscopy -- Diffraction from Crystals -- Electron Diffraction and Crystallography -- Diffraction Contrast in TEM Images -- Diffraction Lineshapes -- Patterson Functions and Diffuse Scattering -- High-Resolution TEM Imaging -- High-Resolution STEM Imaging -- Dynamical Theory.
|
| 650 |
|
0 |
|a Materials science.
|
| 650 |
|
0 |
|a Materials—Surfaces.
|
| 650 |
|
0 |
|a Thin films.
|
| 650 |
|
0 |
|a Crystallography.
|
| 650 |
|
0 |
|a Solid state physics.
|
| 650 |
|
0 |
|a Spectroscopy.
|
| 650 |
|
0 |
|a Microscopy.
|
| 650 |
|
0 |
|a Engineering.
|
| 650 |
1 |
4 |
|a Characterization and Evaluation of Materials.
|
| 650 |
2 |
4 |
|a Surfaces and Interfaces, Thin Films.
|
| 650 |
2 |
4 |
|a Crystallography and Scattering Methods.
|
| 650 |
2 |
4 |
|a Solid State Physics.
|
| 650 |
2 |
4 |
|a Spectroscopy and Microscopy.
|
| 650 |
2 |
4 |
|a Engineering, general.
|
| 700 |
1 |
|
|a Howe, James.
|e author.
|
| 710 |
2 |
|
|a SpringerLink (Online service)
|
| 773 |
0 |
|
|t Springer eBooks
|
| 856 |
4 |
0 |
|u https://doi.org/10.1007/978-3-540-73886-2
|