Transmission Electron Microscopy and Diffractometry of Materials
Autores principales: | Fultz, Brent. (Autor), Howe, James. (Autor) |
---|---|
Autor Corporativo: | SpringerLink (Online service) |
Formato: | eBook |
Lenguaje: | English |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2008.
|
Edición: | 3rd ed. 2008. |
Materias: | |
Acceso en línea: | https://doi.org/10.1007/978-3-540-73886-2 |
Ejemplares similares
-
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science : A User-Oriented Guide /
por: Hofmann, Siegfried.
Publicado: (2013) -
Theoretical Surface Science A Microscopic Perspective /
por: Groß, Axel.
Publicado: (2009) -
New Horizons of Applied Scanning Electron Microscopy /
por: Shimizu, Kenichi., et al.
Publicado: (2010) -
Surface and Interface Analysis An Electrochemists Toolbox /
por: Holze, Rudolf.
Publicado: (2009) -
Multilayer Integrated Film Bulk Acoustic Resonators /
por: Zhang, Yafei., et al.
Publicado: (2013)