Transmission Electron Microscopy and Diffractometry of Materials

Transmission Electron Microscopy and Diffractometry of Materials

Detalles Bibliográficos
Autores principales: Fultz, Brent. (Autor), Howe, James. (Autor)
Autor Corporativo: SpringerLink (Online service)
Formato: eBook
Lenguaje:English
Publicado: Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2008.
Edición:3rd ed. 2008.
Materias:
Materials science.
Materials—Surfaces.
Thin films.
Crystallography.
Solid state physics.
Spectroscopy.
Microscopy.
Engineering.
Characterization and Evaluation of Materials.
Surfaces and Interfaces, Thin Films.
Crystallography and Scattering Methods.
Solid State Physics.
Spectroscopy and Microscopy.
Engineering, general.
Acceso en línea:https://doi.org/10.1007/978-3-540-73886-2
Tabla de Contenidos:
  • Diffraction and the X-Ray Powder Diffractometer
  • The TEM and its Optics
  • Scattering
  • Inelastic Electron Scattering and Spectroscopy
  • Diffraction from Crystals
  • Electron Diffraction and Crystallography
  • Diffraction Contrast in TEM Images
  • Diffraction Lineshapes
  • Patterson Functions and Diffuse Scattering
  • High-Resolution TEM Imaging
  • High-Resolution STEM Imaging
  • Dynamical Theory.

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