Noncontact Atomic Force Microscopy Volume 2 /
| Autor Corporativo: | |
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| Otros Autores: | , , |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2009.
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| Edición: | 1st ed. 2009. |
| Colección: | NanoScience and Technology,
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| Materias: | |
| Acceso en línea: | https://doi.org/10.1007/978-3-642-01495-6 |
Tabla de Contenidos:
- Method for Precise Force Measurements
- Force Spectroscopy on Semiconductor Surfaces
- Tip#x2013;Sample Interactions as a Function of Distance on Insulating Surfaces
- Force Field Spectroscopy in Three Dimensions
- Principles and Applications of the qPlus Sensor
- Study of Thin Oxide Films with NC-AFM: Atomically Resolved Imaging and Beyond
- Atom Manipulation on Semiconductor Surfaces
- Atomic Manipulation on Metal Surfaces
- Atomic Manipulation on an Insulator Surface
- Basic Mechanisms for Single Atom Manipulation in Semiconductor Systems with the FM-AFM
- Multi-Scale Modelling of NC-AFM Imaging and Manipulation at Insulating Surfaces
- Magnetic Exchange Force Microscopy
- First-Principles Simulation of Magnetic Exchange Force Microscopy on Fe/W(001)
- Frequency Modulation Atomic Force Microscopy in Liquids
- Biological Applications of FM-AFM in Liquid Environment
- High-Frequency Low Amplitude Atomic Force Microscopy
- Cantilever Dynamics and Nonlinear Effects in Atomic Force Microscopy.