Digital systems testing and testable design /

Bibliographic Details
Main Authors:	Abramovici, Miron (Author, Autor/a), Breuer, Melvin A. (Autor/a), Friedman, Arthur D. (Autor/a)
Format:	Book
Language:	English
Published:	New York, New York : IEEE, c1990.
Subjects:	ELECTRONICA DIGITAL

Description
Physical Description:	xvii, 652 páginas : ilustraciones
ISBN:	0780310624

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