Digital systems testing and testable design /
Autores principales: | Abramovici, Miron (Autor, Autor/a), Breuer, Melvin A. (Autor/a), Friedman, Arthur D. (Autor/a) |
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Formato: | Libro |
Lenguaje: | English |
Publicado: |
New York, New York :
IEEE,
c1990.
|
Materias: |
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