Digital systems testing and testable design /
Main Authors: | Abramovici, Miron (Author, Autor/a), Breuer, Melvin A. (Autor/a), Friedman, Arthur D. (Autor/a) |
---|---|
Format: | Book |
Language: | English |
Published: |
New York, New York :
IEEE,
c1990.
|
Subjects: |
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