Fundamentals of surface and thin film analysis /

Fundamentals of surface and thin film analysis /

Bibliographic Details
Main Author: Feldman, Leonard C. (Author, Autor/a)
Other Authors: Mayer, James Walter 1930-2013 (Autor/a)
Format: Book
Language:English
Published: Englewood Cliffs, N.J. : PTC Prenctice-Hall, c1986.
Subjects:
SUPERFICIES (TECNOLOGIA) > ANALISIS
PELICULAS DELGADAS > ANALISIS
ANALISIS ESPECTRAL
Description
Physical Description:352 páginas.
ISBN:0135005701

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