Scanning probe microscopy : electrical and electromechanical phenomena at the nanoscale /
Main Author: | |
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Other Authors: | |
Format: | Book |
Language: | English |
Published: |
New York, New York :
Springer,
c2007.
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Subjects: |
Physical Description: | 2 volúmenes : ilustraciones (algunas a color) |
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ISBN: | 0387286675 9780387286679 |