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020705 r ||||| und |
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|a 6998213
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| 040 |
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|a Sistema de Bibliotecas de la Universidad de Costa Rica
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0 |
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|a 500
|b C
|2 00
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| 100 |
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|a Ramírez Porras, Arturo
|e Autor/a
|4 aut
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| 245 |
1 |
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|a Nanostructure size determination in n+-type porous silicon by X-ray diffractormetry and Raman spectroscopy.
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| 300 |
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|a 45-52.
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| 650 |
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|a SEMICONDUCTORES
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| 650 |
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|a RAYOS X
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| 650 |
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|x DIFRACCION
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| 650 |
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|a ESPECTROSCOPIA DE RAMAN
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| 650 |
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|a SILICIO
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| 773 |
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|7 nnab
|t Ciencia y tecnología
|g Vol.21, no.1-2
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| 856 |
4 |
1 |
|y Ver artículo en digital
|u https://revistas.ucr.ac.cr/index.php/cienciaytecnologia/article/view/2691/2640
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