Applied logistic regression /

Bibliographic Details
Main Authors: Hosmer, David W. (Author, Autor/a), Lesmeshow, Stanley (Autor/a)
Format: Book
Language:English
Published: New York : A Wiley-Interscience Publication, c2000.
Edition:2. edition
Series:Wiley Series in Probability and Statistics
Subjects:

Sistema de Bibliotecas de Universidad de Costa Rica

Holdings details from Sistema de Bibliotecas de Universidad de Costa Rica
Call Number: 519.536
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