CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test /

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CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test /

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Formato:	Libro
Lenguaje:	English
Publicado:	c2008.
Acceso en línea:	Ver documento en línea

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