Contactless VLSI measurement and testing techniques /

QR Code

Contactless VLSI measurement and testing techniques /

Bibliographic Details
Format:	Book
Published:	c2018.
Online Access:	Ver documento en línea

Similar Items

Contactless 3d fingerprint identification /
Published: (2018)

VLSI test principles and architectures : design for testability /
by: Laung-Terng, Wang
Published: (2006)

VLSI Design and Test : 21st International Symposium, VDAT 2017, Roorkee, India, June 29 - July 2, 2017, Revised Selected Papers /
Published: (2017)

Machine learning techniques for performance prediction and diagnosis of VLSI designs /
by: Carvajal Barboza, Erick Mauricio 1992-
Published: (2021)

Defect-oriented testing for nano-metric CMOS VLSI circuits /
by: Sachdev, Manoj
Published: (2007)

Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /
by: Bushnell, Michael L.
Published: (2000)

INtroduction to VLSI systems /
by: Mead, Carver Andress 1934-, et al.
Published: (1980)

VLSI 83: VLSI design of digital systems: proceedings of the IFIP TC 10
by: Anceau, F
Published: (1983)

VLSI handbook: Silicon, Gallium Arsenide, and Superconductor Circuits
by: Di Giacomo, Joseph, ed.
Published: (1989)

Clocking in modern VLSI systems /
Published: (2009)

Analog VLSI and neural systems /
by: Mead, Carver Andress 1934-, et al.
Published: (1989)

Fundamentals of modern VLSI devices /
by: Taur, Yuan 1946-, et al.
Published: (1998)

Clocking in Modern VLSI Systems /
Published: (2009)

Measurement and evaluation techniques

Tritium measurement techniques
Published: (1976)

CMOS VLSI design : a circuits and systems perspective /
by: Weste, Neil H. E.
Published: (2011)

CMOS VLSI design : a circuits and systems perspective /
by: Weste, Neil H. E.
Published: (2011)

Techniques in testing /
by: Madsen, Harold S., et al.
Published: (1983)

Techniques in testing
by: Madsen, Harold S.
Published: (1983)

Techniques in testing
by: Madsen, Harold S.
Published: (1983)

Techniques in testing
by: Madsen, Harold S.
Published: (1983)

Minimizing and Exploiting Leakage in VLSI Design /
by: Jayakumar, Nikhil., et al.
Published: (2010)

3-Dimensional VLSI : a 2.5-Dimensional Integration Scheme /
by: Deng, Yangdong
Published: (2010)

3-Dimensional VLSI : a 2.5-dimensional integration scheme /
by: Deng, Yangdong
Published: (2010)

Principles of CMOS VLSI design : a systems perspective /
by: Weste, Neil H. E., et al.
Published: (1993)

Advanced in-flight measurement techniques /
by: Agocs, Janos
Published: (2013)

Advanced in-flight measurement techniques /
Published: (2013)

Electronic Instrumentation and Measurement Techniques /
by: Cooper, William David
Published: (1970)

Electronic instrumentation and measurement techniques /
by: Cooper, William David
Published: (1978)

Magnets and magnetic measuring techniques /
by: Wakerling, R. K.
Published: (1949)

The role of measurement and testing in economics /
by: Mizon, Grayham E.
Published: (1990)

Readings in psychological tests and measurements /
by: Barnette, Warren Leslie
Published: (1964)

Software testing techniques /
by: Beizer, Boris 1934-, et al.
Published: (1983)

Tested training techniques /
by: Haas, Kenneth Brooks n. 1898, et al.
Published: (1950)

VLSI Digital signal processors : an introduction to rapid prototyping and design synthesis.
by: Madisetti, Vijay K., et al.
Published: (1995)

Advanced symbolic analysis for VLSI systems : methods and applications.

Very Large Scale Integration (VLSI) : fundamentals and applications /
by: Barbe, D. F., et al.
Published: (1987)

Carbon nanotube based VLSI interconnects : Analysis and Design /
Published: (2015)

Family measurement techniques : abstracts of published instruments, 1935-1965.
by: Straus, Murray Arnold 1926-, et al.
Published: (1969)

Computer aided logical design with emphasis on VLSI /
by: Hill, Frederick J., et al.
Published: (1993)