Applied pattern recognition /
| Otros Autores: | Bunke, Horst (Editor ), Kandel, Abraham (Editor ), Last, Mark (Editor ) |
|---|---|
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
Berlin, Alemania :
Springer,
2008.
|
| Edición: | 1 edición |
| Materias: |
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