Copper Interconnect Technology /

Bibliographic Details
Main Author: Gupta, Tapan. (Author)
Corporate Author: SpringerLink (Online service)
Format: eBook
Language:English
Published: New York, NY : Springer New York : Imprint: Springer, 2009.
Edition:1st ed. 2009.
Subjects:
Table of Contents:
  • Dielectric Materials
  • Diffusion and Barrier Layers
  • Pattern Generation
  • Deposition Technologies of Materials for Cu-Interconnects
  • The Copper Damascene Process and Chemical Mechanical Polishing
  • Conduction and Electromigration
  • Routing and Reliability.