Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability /

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Emerging Nanotechnologies : Test, Defect Tolerance, and Reliability /

Bibliographic Details
Corporate Author:	SpringerLink (Online service)
Other Authors:	Tehranipoor, Mohammad. (Editor)
Format:	eBook
Language:	English
Published:	New York, NY : Springer US : Imprint: Springer, 2008.
Edition:	1st ed. 2008.
Series:	Frontiers in Electronic Testing, 37
Subjects:	Electronic circuits. Electronics. Microelectronics. Nanotechnology. Quality control. Reliability. Industrial safety. Electrical engineering. Circuits and Systems. Electronics and Microelectronics, Instrumentation. Quality Control, Reliability, Safety and Risk. Electrical Engineering.

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