Ellipsometry at the Nanoscale /

Detalles Bibliográficos
Autor Corporativo:	SpringerLink (Online service)
Otros Autores:	Losurdo, Maria. (Editor ), Hingerl, Kurt. (Editor )
Formato:	eBook
Lenguaje:	English
Publicado:	Berlin, Heidelberg : Springer Berlin Heidelberg : Imprint: Springer, 2013.
Edición:	1st ed. 2013.
Materias:	Nanotechnology. Physical measurements. Measurement . Materials science. Nanotechnology and Microengineering. Measurement Science and Instrumentation. Characterization and Evaluation of Materials.

Descripción
Descripción Física:	XXIV, 730 p. 423 illus., 106 illus. in color. : online resource.
ISBN:	9783642339561

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