Ellipsometry at the Nanoscale /
| Autor Corporativo: | |
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| Otros Autores: | , |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2013.
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| Edición: | 1st ed. 2013. |
| Materias: |
Tabla de Contenidos:
- Preamble
- Preface
- A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis
- Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations
- Relationship between Surface Morphology and Effective Medium Roughness
- Plasmonics and Effective-Medium Theory
- Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings
- Mueller matrix applied to nanostructures
- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles
- Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition
- THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures
- Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates
- Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale
- Polarimetric and other Optical Probes for the Solid - Liquid Interface
- Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices
- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications
- Ellipsometry of semiconductor nanocrystals
- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry
- Thin film applications in research and industry characterized by spectroscopic ellipsometry
- Ellipsometry and Correlation Measurements
- Nanotechnology: Applications and markets, present and future.