Ellipsometry at the Nanoscale /
Autor Corporativo: | SpringerLink (Online service) |
---|---|
Otros Autores: | Losurdo, Maria. (Editor ), Hingerl, Kurt. (Editor ) |
Formato: | eBook |
Lenguaje: | English |
Publicado: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2013.
|
Edición: | 1st ed. 2013. |
Materias: |
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