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02952nam a22003615i 4500 |
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000281466 |
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20210719114842.0 |
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cr nn 008mamaa |
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130321s2013 gw | s |||| 0|eng d |
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|a 9783642339561
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|a 10.1007/978-3-642-33956-1
|2 doi
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| 040 |
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|a Sistema de Bibliotecas del Tecnológico de Costa Rica
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|a Ellipsometry at the Nanoscale /
|c edited by Maria Losurdo, Kurt Hingerl.
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| 250 |
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|a 1st ed. 2013.
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| 260 |
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2013.
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| 300 |
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|a XXIV, 730 p. 423 illus., 106 illus. in color. :
|b online resource.
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| 336 |
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|a text
|b txt
|2 rdacontent
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|a computer
|b c
|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a Preamble -- Preface -- A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis -- Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations -- Relationship between Surface Morphology and Effective Medium Roughness -- Plasmonics and Effective-Medium Theory -- Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings -- Mueller matrix applied to nanostructures -- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles -- Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition -- THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures -- Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates -- Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale -- Polarimetric and other Optical Probes for the Solid - Liquid Interface -- Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices -- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications -- Ellipsometry of semiconductor nanocrystals -- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry -- Thin film applications in research and industry characterized by spectroscopic ellipsometry -- Ellipsometry and Correlation Measurements -- Nanotechnology: Applications and markets, present and future.
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| 650 |
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|a Nanotechnology.
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| 650 |
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|a Physical measurements.
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| 650 |
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|a Measurement .
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| 650 |
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|a Materials science.
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| 650 |
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|a Nanotechnology and Microengineering.
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| 650 |
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|a Measurement Science and Instrumentation.
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| 650 |
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|a Characterization and Evaluation of Materials.
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| 650 |
2 |
4 |
|a Nanotechnology.
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| 700 |
1 |
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|a Losurdo, Maria.
|e editor.
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| 700 |
1 |
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|a Hingerl, Kurt.
|e editor.
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| 710 |
2 |
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|a SpringerLink (Online service)
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| 773 |
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|t Springer eBooks
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| 900 |
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|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
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