|
|
|
|
| LEADER |
02045nam a22003975i 4500 |
| 001 |
000283365 |
| 005 |
20211103131747.0 |
| 007 |
cr nn 008mamaa |
| 008 |
100301s2008 xxu| s |||| 0|eng d |
| 020 |
|
|
|a 9780387690117
|
| 024 |
7 |
|
|a 10.1007/978-0-387-69011-7
|2 doi
|
| 040 |
|
|
|a Sistema de Bibliotecas del Tecnológico de Costa Rica
|
| 100 |
1 |
|
|a Orshansky, Michael.
|e author.
|
| 245 |
1 |
0 |
|a Design for Manufacturability and Statistical Design :
|b A Constructive Approach /
|c by Michael Orshansky, Sani Nassif, Duane Boning.
|
| 250 |
|
|
|a 1st ed. 2008.
|
| 260 |
# |
# |
|a New York, NY :
|b Springer US :
|b Imprint: Springer,
|c 2008.
|
| 300 |
|
|
|a XIV, 316 p. :
|b online resource.
|
| 336 |
|
|
|a text
|b txt
|2 rdacontent
|
| 337 |
|
|
|a computer
|b c
|2 rdamedia
|
| 338 |
|
|
|a online resource
|b cr
|2 rdacarrier
|
| 490 |
1 |
|
|a Integrated Circuits and Systems,
|
| 505 |
0 |
|
|a Sources of Variability -- Front End Variability -- Back End Variability -- Environmental Variability -- Variability Characterization and Analysis -- Test Structures For Variability -- Statistical Foundations Of Data Analysis And Modeling -- Design Techniques for Systematic Manufacturability Problems -- Lithography Enhancement Techniques -- Ensuring Interconnect Planarity -- Statistical Circuit Design -- Statistical Circuit Analysis -- Statistical Static Timing Analysis -- Leakage Variability And Joint Parametric Yield -- Parametric Yield Optimization -- Conclusions.
|
| 650 |
|
0 |
|a Electronic circuits.
|
| 650 |
|
0 |
|a Computer-aided engineering.
|
| 650 |
|
0 |
|a Industrial engineering.
|
| 650 |
|
0 |
|a Production engineering.
|
| 650 |
|
0 |
|a Electrical engineering.
|
| 650 |
1 |
4 |
|a Circuits and Systems.
|
| 650 |
2 |
4 |
|a Computer-Aided Engineering (CAD, CAE) and Design.
|
| 650 |
2 |
4 |
|a Industrial and Production Engineering.
|
| 650 |
2 |
4 |
|a Electrical Engineering.
|
| 700 |
1 |
|
|a Nassif, Sani.
|e author.
|
| 700 |
1 |
|
|a Boning, Duane.
|e author.
|
| 710 |
2 |
|
|a SpringerLink (Online service)
|
| 773 |
0 |
|
|t Springer eBooks
|
| 900 |
|
|
|a Libro descargado a ALEPH en bloque (proveniente de proveedor)
|