Design for Manufacturability and Statistical Design : A Constructive Approach /
| Autores principales: | , , |
|---|---|
| Autor Corporativo: | |
| Formato: | eBook |
| Lenguaje: | English |
| Publicado: |
New York, NY :
Springer US : Imprint: Springer,
2008.
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| Edición: | 1st ed. 2008. |
| Colección: | Integrated Circuits and Systems,
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| Materias: |
Tabla de Contenidos:
- Sources of Variability
- Front End Variability
- Back End Variability
- Environmental Variability
- Variability Characterization and Analysis
- Test Structures For Variability
- Statistical Foundations Of Data Analysis And Modeling
- Design Techniques for Systematic Manufacturability Problems
- Lithography Enhancement Techniques
- Ensuring Interconnect Planarity
- Statistical Circuit Design
- Statistical Circuit Analysis
- Statistical Static Timing Analysis
- Leakage Variability And Joint Parametric Yield
- Parametric Yield Optimization
- Conclusions.